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Configuration Options
The NANO DCM is an indentation
head assembly that can be
configured in several ways:
As an addition to any new or
existing NANO Indenter XP or
NANO Indenter II® series system
As a substitution for the
standard low-load head of a
new NANO Indenter system
As a stand-alone unit using
the NANO Indenter electronics
and operating system
The NANO DCM’s flexible
mounting bracket provides
multiple mounting options.
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Dynamic characterization of surfaces, interfaces, and thin films |
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With the Nano Dynamic Contact Module (NANO DCM), the range of load-displacement
experimentation has been extended down to the surface contact
level. Now researchers can study not only the first few nanometers of an indentation
into the surface of a material, but even the precontact mechanics.
PHYSICAL PROPERTIES OF THE NANO DCM
To be precise and widely applicable, nanoindentation
testing must be dynamic. Static and
quasi-static approaches not only limit the mechanical
properties that can be determined, but
can lead to errors in general. The NANO DCM
is a fully dynamic nanoindentation system for
ultra-low-load mechanical properties characterization.
When applying the patented Continuous
Stiffness Measurement (NANO CSM)
technique, the NANO DCM delivers the full
benefits of dynamic nanoindentation testing.
DISPLACEMENT RESOLUTION
At this scale, the noise level of the indentation
system also must be considered to determine its
actual displacement measurement capability.
Using a standard calculation method, the displacement
resolution of the NANO DCM is 0.0002
nm (0.2 picometers). More importantly, data
from our production facility (not from laboratory
conditions) shows that the noise levels are
typically less than an angstrom. The NANO DCM
is not overly sensitive to the environment and
has a considerably lower noise floor than any
instrument of its type on the market today.
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A 6nm-deep indentation into fused silica. Loading and unloading data show complete reversiblity, i.e., a totally elastic contact.
INDENTER COLUMN MASS
With an indenter column weighing in at a mere
100 milligrams, the system is sensitive to surface
forces and dynamics, since it carries very little inertia
of its own. The combination of low mass and
high resonant frequency has a direct beneficial effect
on the system’s performance—the NANO DCM
is very sensitive to the surface. As a result, surface
contact determination, one of the most important
factors in ultra-low load indentation testing,
is extremely accurate and reproducible.
HIGH RESONANT FREQUENCY
Because the NANO DCM’s nominal resonant
frequency of 180 Hz is well above normal
floor-vibration and other environmental frequencies,
the NANO DCM gives clean, reliable
data in virtually any laboratory environment.
LOW DAMPING COEFFICIENT
At 0.02 Ns/m, the system damping of the
NANO DCM is more than two orders of magnitude
less than that of the NANO Indenter
II system. In terms of capabilities, this means
that the NANO DCM can make quantitative
measurements with smaller contacts
and on materials with lower stiffnesses and
damping coefficients, such as polymers and
elastomers, than previously was possible.
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Download DCM PDF
Technical Specs
Contact MTS
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