MTS Nano Instruments
Visit Agilent Technologies
products/virtual
News
Products
Services
Applications
Support
Contact Us
products/virtual products/virtual
Software Components

The Virtual INDENTER software bundle includes the following components:

A user-friendly Batch Design Wizard that prompts the user through each step of setting up a batch of simulations

The finite-element engine, COSMOS™

The averaging and plotting program, Analyst, which can be used to graph results from any combination of finite element simulations and/or Nano Indenter experiments



Features and Benefits

Up to 99 simulations per batch; sequential simulations execute with no interaction from user

Automatic meshing of a variety of samples and indenters:
   Bulk materials
   Up to 3 stacked films
   Embedded particles/fibers

Spherical, conical, flat-punch, or area-function indenters

Variety of constitutive models Easy comparison to experimental data from NANO Indenter systems through Analyst™

Libraries for storing materials and indenter tips

Automated output to Microsoft ExcelTM workbooks

Automated movie creation (AVI)

Runs on most desktop PCs

Complements all commercial instrumented indentation systems

Quick ramp-up time. No FEA experience required

Smart interpretation of physical data from complex samples, such as thin films or embedded particles

Tool for critically evaluating analytic models for interpretation of physical data

Informative, eye-catching graphics for conference presentations

Effective tool for education
 
 
  Simplifies finite element simulations of indentation experiments
The Virtual INDENTER software package is an essential analysis tool that complements the capabilities of your physical instrumented indentation system. Virtual Indenter is a complete software bundle that allows the user to easily setup, execute, and analyze finite-element simulations of indentation experiments.

WHY FINITE ELEMENT ANALYSIS?
Finite element analysis (FEA) has many applications in instrumented indentation testing, as evidenced by a myriad scientific publications. Traditional models for interpreting experimental instrumented indentation data assume that the test sample is a semi-infinite, homogeneous material, with limited plasticity. However, when the test sample does not fit this description, FEA provides a tool for more sophisticated modeling. For example, if you are interested in thin, compliant films on a hard substrate, FEA may be used to quantify the influence of the hard substrate on the experimentally measured modulus of the film. As a second example, suppose you are testing a novel material system. How well should you expect the Oliver-Pharr technique for determining contact area to work on your unique material system? FEA provides the answer!

FEA IN EDUCATION
Finite-element analysis is an extremely useful tool for educating students and colleagues in the field of instrumented indentation testing. And because Virtual INDENTER is so easy to use, newcomers can be running their own simulations in just minutes. For example, Virtual INDENTER is entirely appropriate for use as an undergraduate teaching tool.
Cross-sectional view of stress contours



Imagine being able to use simulated load-displacement data with 2D animated color graphics to illustrate the following phenomena:
  • The location of maximum shear stress in a Hertzian contact
  • Relationship between “hardness” and yield stress in metals
  • The relationship between force and displacement for elastic contact between a cone and a flat surface
  • Elastic recovery during unloading
  • Situations in which material “piles-up” around the indenter, and so the calculated contact area is too small
  • Situations in which “sink-in” is accentuated, and so the calculated contact area is too big
  • The influence of a mounting material, like epoxy, on the force-displacement data for hard, embedded particles
  • Locations of stress build-up in geometrically complex samples.

 
Download Virtual Indenter PDF            Contact MTS
   home | products | services | applications | support | about | contact | terms and conditions | privacy policy
  © Agilent Technologies, Inc. 2008
Other trademarks are properties of their respective owners.